IoT & Embedded

Microcontrollers, SBCs, sensors, home automation radios, and edge devices.

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Semiconductor Imaging Solutions for Metrology & Inspection | Tucsen

Different inspection and metrology tasks require different imaging approaches. We develop tailored semiconductor imaging solutions based on application requirements, from wafer inspection to advanced packaging. Spectral Range: 180–1100 nmTypical QE: 63.9% @ 266 nmMax. Line Rate: 1 MHz @ 8 / 10 bitTDI Stage: 256Data Interface: 100G / 40G CoFCooling Method: Air / Liquid…